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Structured Clinical Interview for DSM-IV : ウィキペディア英語版
Structured Clinical Interview for DSM-IV
The Structured Clinical Interview for DSM-IV Axis I Disorders (SCID-I) is a diagnostic exam used to determine DSM-IV Axis I disorders (major mental disorders). The SCID-II is a diagnostic exam used to determine Axis II disorders (personality disorders). There are at least 700 published studies in which the SCID was the diagnostic instrument used. Major parts of the SCID have been translated into other languages, including Danish, French, German, Greek, Hebrew, Italian, Portuguese, Spanish, Swedish, Turkish, and Zulu.
An Axis I SCID assessment with a psychiatric patient usually takes between 1 and 2 hours, depending on the complexity of the subject's psychiatric history and their ability to clearly describe episodes of current and past symptoms. A SCID with a non-psychiatric patient takes 1/2 hour to 1-1/2 hours. (See editions below.) A SCID-II personality assessment takes about 1/2 to 1 hour.
The instrument was designed to be administered by a mental health professional, for example a psychologist or psychiatrist. This must be someone who has relevant professional training and has had experience performing unstructured, open-ended question, diagnostic evaluations. However, for the purposes of some research studies, non-clinician research assistants, who have extensive experience with the study population in question, and who have demonstrated competence, have been trained to use the SCID. The less clinical experience and specific education the potential interviewer has had, the more training is required.
==DSM-IV editions of SCID-I and SCID-II==
There are several editions of the SCID-I addressed to different audiences:〔http://www.scid4.org/info/refscid.html〕
* Three Research Versions:
*
* Patient Edition (SCID-I/P)〔First, Michael B., Spitzer, Robert L, Gibbon Miriam, and Williams, Janet B.W.: Structured Clinical Interview for DSM-IV-TR Axis I Disorders, Research Version, Patient Edition. (SCID-I/P) New York: Biometrics Research, New York State Psychiatric Institute, November 2002.〕
*
* Patient Edition, with psychotic screen (SCID-I/P W/ PSY SCREEN)〔First, Michael B., Spitzer, Robert L, Gibbon Miriam, and Williams, Janet B.W.: Structured Clinical Interview for DSM-IV-TR Axis I Disorders, Research Version, Patient Edition With Psychotic Screen (SCID-I/P W/ PSY SCREEN) New York: Biometrics Research, New York State Psychiatric Institute, November 2002.〕
*
* Non-patient Edition (SCID-I/NP),〔First, Michael B., Spitzer, Robert L, Gibbon Miriam, and Williams, Janet B.W.: Structured Clinical Interview for DSM-IV-TR Axis I Disorders, Research Version, Non-patient Edition. (SCID-I/NP) New York: Biometrics Research, New York State Psychiatric Institute, November 2002.〕
* A Clinical Trials Version (SCID-CT)〔First, Michael B., Williams, Janet B.W., Spitzer, Robert L., and Gibbon, Miriam: Structured Clinical Interview for DSM-IV-TR Axis I Disorders, Clinical Trials Version (SCID-CT). New York: Biometrics Research, New York State Psychiatric Institute, 2007.〕
* Clinician Version (SCID-CV)〔First, Michael B., Spitzer, Robert L, Gibbon Miriam, and Williams, Janet B.W.: Structured Clinical Interview for DSM-IV Axis I Disorders, Clinician Version (SCID-CV). Washington, D.C.: American Psychiatric Press, Inc., 1996.〕
The SCID-II for DSM-IV comes in a single edition.〔First, MB., Gibbon M, Spitzer RL, Williams, JBW, Benjamin LS.: Structured Clinical Interview for DSM-IV Axis II Personality Disorders, (SCID-II). Washington, D.C.: American Psychiatric Press, Inc., 1997.〕
SCID versions for DSM-5 are under development. See the (SCID website ) for updates.

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